A team of researchers has developed a novel computational imaging system designed to address the challenges of real-time monitoring in ultrafast laser material processing. The new system, known as Dual-Path Snapshot Compressive Microscopy (DP-SCM), represents a significant advancement in the field, offering unprecedented capabilities for high-speed, high-resolution imaging. The team was led by Yuan Xin from Westlake University and Shi Liping from Xidian University.
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