A University of Texas at Dallas graduate student, his advisor and industry collaborators believe they have addressed a long-standing problem troubling scientists and engineers for more than 35 years: How to prevent the tip of a scanning tunneling microscope from crashing into the surface of a material during imaging or lithography. Details of the group’s solution appeared in the January issue of the journal Review of Scientific Instruments, which is published by the American Institute of Physics. Scanning tunneling microscopes (STMs) operate in an ultra-high vacuum, bringing a fine-tipped p…
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